Stress-induced birefringence and extinction ratio

Gaoping Li; Zhaojing Yang; Chunli Lu; Xunzhang Liu; Shiming Xiang

doi:10.1117/12.318450

10 August 1998 Stress-induced birefringence and extinction ratio

Gaoping Li, Zhaojing Yang, Chunli Lu, Xunzhang Liu, Shiming Xiang

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318450
Event: Photonics China '98, 1998, Beijing, China

Abstract

The stress-induced birefringence, extinction ratio and their relation are studied in this paper. By means of building up their relation and measuring stress-induced birefringence, we can get more precise extinction ratio of relevant materials, expand the extinction ratio measurement range, and improve the measurement repeatability error greatly.

Citation Download Citation

Gaoping Li, Zhaojing Yang, Chunli Lu, Xunzhang Liu, and Shiming Xiang "Stress-induced birefringence and extinction ratio", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318450

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