Paper
6 July 1999 Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials
Mehrdad Mohebi, Nooshin Jamasbi, Omar Morales, Jesus Garduno, Ali A. Said, Eric W. Van Stryland
Author Affiliations +
Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358373
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia
Abstract
We present a new variation of the Z-scan technique, which provides a sensitive method for measurement of the nonlinear refractive index of materials. The method is based on imaging of a top hat beam onto a blocking disk; therefore, it is very sensitive. In addition to greater sensitivity the method offers the advantage that it does not require a Gaussian beam, therefore it can be used with low energy lasers with any beam profile.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mehrdad Mohebi, Nooshin Jamasbi, Omar Morales, Jesus Garduno, Ali A. Said, and Eric W. Van Stryland "Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); https://doi.org/10.1117/12.358373
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KEYWORDS
Refractive index

Gaussian beams

Laser energy

Nonlinear optics

Beam propagation method

Image enhancement

Image transmission

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