Paper
11 November 1998 Evaluation of imperfect gold/glass interfaces using scanning acoustic microscopy
Klaus Kosbi, Thomas Blum, Ulla Scheer, Siegfried Boseck
Author Affiliations +
Proceedings Volume 3581, Acousto-Optics and Applications III; (1998) https://doi.org/10.1117/12.330495
Event: Acousto-Optics and Applications III, 1998, Gdansk-Jurata, Poland
Abstract
A quantitative measurement method for the evaluation of thin film adhesion is desired in a wide range of thin film applications. As an example, we investigated the bonding conditions of gold layers on glass substrate. The interface was modified by introducing a thin layer of silicone oil. With increasing oil thickness we assume the adhesion to get worse. Using quantitative scanning acoustic microscopy (SAM) surface acoustic waves (SAW) dispersion curves were measured. Significant variations with the oil layer thickness were found. By fitting the measured data to theoretical curves, stiffness constants which describe the quality of adhesion, can be derived. Our theoretical model is based on the quasi-static model developed by BAIK and THOMPSON. Variation of the interfacial stiffness constants leads to good adhesion Rayleigh-type SAWs propagate on the samples, whereas in the case of bad adhesion a Sezawa-type SAW is generated. The SAM measurements are in good agreement with destructive measurements using the scratch test.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Klaus Kosbi, Thomas Blum, Ulla Scheer, and Siegfried Boseck "Evaluation of imperfect gold/glass interfaces using scanning acoustic microscopy", Proc. SPIE 3581, Acousto-Optics and Applications III, (11 November 1998); https://doi.org/10.1117/12.330495
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interfaces

Acoustics

Gold

Stereolithography

Glasses

Microscopy

Silicon

Back to Top