Paper
8 February 1999 Evaluation of residual stress gradients by diffraction methods with wavelets: a neural network approach
Harald Wern, Marc Ringeisen
Author Affiliations +
Abstract
The presence of residual stress gradients is often revealed by x-ray diffraction analysis. Because x-rays always detect an averaged information due to absorption, in the past some approaches have been employed to retrieve the true-z- profiles from the measured (tau) -profiles where (tau) is in general the 1/e information depth of the diffracted intensity. However, all problems which can be described as so called inverse problems like x-ray diffraction analysis are often extremely ill-conditioned. What makes the wavelet basis interesting is that individual wavelet functions are quite localized in space and simultaneously they also are quite localized in frequency. This particular kind of dual localization achieved by wavelets renders operators to be sparse to some high accuracy, when transformed into the wavelet domain. However, the number of required wavelet coefficients for the representation of a residual stress gradients in general still exceeds the number of measurements. therefore, a multilayer feed forward neural network approach has been investigated. With the implementation of a fast backtracking algorithm, suitable learning rates can be achieved. The advantages of this neural network approach, which to the authors knowledge is first introduce in the field of residual stress analysis, will be discussed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harald Wern and Marc Ringeisen "Evaluation of residual stress gradients by diffraction methods with wavelets: a neural network approach", Proc. SPIE 3585, Nondestructive Evaluation of Aging Materials and Composites III, (8 February 1999); https://doi.org/10.1117/12.339863
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Cited by 2 scholarly publications.
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KEYWORDS
Wavelets

Neural networks

X-ray diffraction

Diffraction

X-rays

Inverse problems

Neurons

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