Very Large Scale Integration (VLSI) Approach To Feature Extraction

James S. Duncan; Werner Frei

doi:10.1117/12.965988

17 March 1983 Very Large Scale Integration (VLSI) Approach To Feature Extraction

James S. Duncan, Werner Frei

Proceedings Volume 0359, Applications of Digital Image Processing IV; (1983) https://doi.org/10.1117/12.965988
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

The lower levels of many image processing and pattern recognition systems require a high degree of machine throughput. This is especially true in real-time (or pseudo-real time) systems where all the pixels in an image frame must be processed as quickly as possible. This paper proposes a method directed primarily toward extracting low level features quickly and efficiently. This method is based on projecting the image into characteristic subspaces using appropriate orthogonal basis functions. These basis operators are designed with an emphasis on modularity; thus, they will be useful in hierarchical processing and, significantly, they will fit well into a Very Large Scale Integrated (VLSI) circuit design. Chips consisting of many of these modules, under executive processor control, could now be used in imaging systems that require fast feature detection using compact and efficient hardware.

Citation Download Citation

James S. Duncan and Werner Frei "Very Large Scale Integration (VLSI) Approach To Feature Extraction", Proc. SPIE 0359, Applications of Digital Image Processing IV, (17 March 1983); https://doi.org/10.1117/12.965988

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