Paper
26 May 1999 Steady-state and transient defect populations in KH2PO4 subsequent to high-fluence laser irradiation
Stavros G. Demos, Michael C. Staggs, Harry B. Radousky, James J. De Yoreo
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Abstract
Microscopic fluorescence imaging and time-resolved Raman scattering are employed to investigate the effect of high power 355 nm laser irradiation on preexisting and transient defect populations in KH2PO4. Defect clusters in the bulk of KDP crystals are imaged with 1 micron spatial resolution using their NIR emission. The intensity of the emission clusters varies widely within the image field. The exposure of the crystal at high power 355 nm, 3 ns laser irradiation leads to a reduction of the number of observed optically active centers. In addition, time resolved Raman scattering was employed to study the transient generation of defects during high power 355 nm laser irradiation.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stavros G. Demos, Michael C. Staggs, Harry B. Radousky, and James J. De Yoreo "Steady-state and transient defect populations in KH2PO4 subsequent to high-fluence laser irradiation", Proc. SPIE 3610, Laser Material Crystal Growth and Nonlinear Materials and Devices, (26 May 1999); https://doi.org/10.1117/12.349237
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KEYWORDS
Crystals

Raman scattering

Laser crystals

Luminescence

Absorption

High power lasers

Laser irradiation

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