Diffraction Limited Focusing Grating For High Energy Laser Diagnostics

Francois M. Mottier

doi:10.1117/12.934209

23 August 1983 Diffraction Limited Focusing Grating For High Energy Laser Diagnostics

Francois M. Mottier

Proceedings Volume 0365, Adaptive Optics Systems and Technology; (1983) https://doi.org/10.1117/12.934209
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

A focusing sampling grating can be synthesized by combining a linear grating with a computer plotted zone plate. Phase front distortion figures below λ/20 can be achieved for sampler geometries calling for any diffraction angle and f-numbers down to one. The technique can be generalized for curved substrates.

Citation Download Citation

Francois M. Mottier "Diffraction Limited Focusing Grating For High Energy Laser Diagnostics", Proc. SPIE 0365, Adaptive Optics Systems and Technology, (23 August 1983); https://doi.org/10.1117/12.934209

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