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10 March 1999 Correct-by-construction approach to MEMS design and analysis
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Proceedings Volume 3680, Design, Test, and Microfabrication of MEMS and MOEMS; (1999) https://doi.org/10.1117/12.341174
Event: Design, Test, and Microfabrication of MEMS/MOEMS, 1999, Paris, France
Abstract
The need for general modeling and analysis tools for MEMS devices has been well established, and several software packages designed to address these needs have appeared in the last five years. While being powerful and comprehensive, existing tools often require specialized knowledge of the methods involved in the analysis, and lack integration into a complete design environment. This paper describes a new MEMS design and analysis tool that uses a correct-by- construction approach in a tightly integrated environment of layout, 3D modeling, analysis, and system design. The MEMS design tool suite is integrated into an existing integrated circuit design package. Our goal is to automate as many steps of the process as possible, thus lowering the barrier to MEMS design.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barry Dyne and David A. Bernstein "Correct-by-construction approach to MEMS design and analysis", Proc. SPIE 3680, Design, Test, and Microfabrication of MEMS and MOEMS, (10 March 1999); https://doi.org/10.1117/12.341174
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