Paper
10 March 1999 Fault simulation of MEMS using HDLs
Benoit Charlot, Salvador Mir, Erika F. Cota, Marcelo Lubaszewski, Bernard Courtois
Author Affiliations +
Proceedings Volume 3680, Design, Test, and Microfabrication of MEMS and MOEMS; (1999) https://doi.org/10.1117/12.341215
Event: Design, Test, and Microfabrication of MEMS/MOEMS, 1999, Paris, France
Abstract
This paper describes an approach to fault simulation of MEMS using an analog Hardware Description Language (HDL). HDL languages facilitate the description of mixed-domain devices, providing powerful representation capabilities which are not limited to the use of the traditional equivalent electrical modes. This is exploited in this paper for fault simulation of MEMS, showing the advantages of using an HDL for this task. An electro-thermal converter is used as test vehicle, for which an equivalent electrical more is readily obtained. Typical defects and failure mechanisms which can affect these devices fabricated using CMOS-compatible bulk micromachining are shown. These defects are used for illustrating the fault simulation approach which appears to be more comprehensive and systematic than previous approaches.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benoit Charlot, Salvador Mir, Erika F. Cota, Marcelo Lubaszewski, and Bernard Courtois "Fault simulation of MEMS using HDLs", Proc. SPIE 3680, Design, Test, and Microfabrication of MEMS and MOEMS, (10 March 1999); https://doi.org/10.1117/12.341215
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Cited by 28 scholarly publications.
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KEYWORDS
Microelectromechanical systems

Resistors

Instrument modeling

Systems modeling

Finite element methods

Analog electronics

Device simulation

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