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20 January 1999 Optical nanoprobes for scanning near-field optical microscopy: functions, requirements, fabrication, and theoretical reconstruction from far-field investigation
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Proceedings Volume 3688, 6th International Conference on Industrial Lasers and Laser Applications '98; (1999) https://doi.org/10.1117/12.337544
Event: 6th International Conference on Industrial Lasers and Laser Applications '98, 1998, Shatura, Moscow Region, Russian Federation
Abstract
Various kinds of nanoprobes for scanning near-field optical microscopy with the requirements and peculiarities of fabrication are discussed. A set up for fabrication of fiber made tips is presented and new ideas of optical superresolution technique for SNOM subwavelength apertures recognition is suggested.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vadim P. Veiko, V. M. Voronin, Nikolay B. Voznesensky, Sergey A. Rodionov, Igor B. Smirnov, and Alexey I. Kalachev "Optical nanoprobes for scanning near-field optical microscopy: functions, requirements, fabrication, and theoretical reconstruction from far-field investigation", Proc. SPIE 3688, 6th International Conference on Industrial Lasers and Laser Applications '98, (20 January 1999); https://doi.org/10.1117/12.337544
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