Paper
19 July 1999 Nonuniformity correction of resistor arrays with a precision projector/sensor mapping method
Mark A. Venables, Stephen Paul Lake, David W. Gough, Alan P. Pritchard
Author Affiliations +
Abstract
We present a description of a new non-uniformity correction system for infra-red resistor arrays which has been designed to produce the maximum uniformity of output from neighbor pixels achievable, with a special emphasis on performance at low (ambient) output radiance levels. The system is based on a precision 1:1 mapping between the sensor and projector pixels, and utilizes an all-on approach for projector pixel illumination. The philosophy for system choices is presented, together with analyses and measurements. The system hardware is outlined, and measurements are presented from the system in use showing that at ambient levels, uniformity of better than 100 mK can be achieved between neighbor pixels. This corresponds to a uniformity deviation of some 0.35%.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark A. Venables, Stephen Paul Lake, David W. Gough, and Alan P. Pritchard "Nonuniformity correction of resistor arrays with a precision projector/sensor mapping method", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352920
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KEYWORDS
Sensors

Nonuniformity corrections

Projection systems

Distortion

Image registration

Imaging systems

Resistors

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