Paper
19 July 1999 Thermo-optical characterization of a low-background infrared chamber and wideband infrared scene projector (WISP) array for hardware-in-the-loop testing
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Abstract
The KHILS Vacuum Cold Chamber (KVACC) provides the capability of testing IR seekers with scenes involving a `cold' background, more closely simulating a high altitude/exoatmospheric engagement. During the past year, a gaseous helium refrigeration system has been installed to simplify the logistics of cooling the chamber. An antechamber has also been installed to serve as a chamber for the sensor under test. A WISP array was installed in the Source Chamber. A thermal control system was developed by connecting the array to a cold surface by way of a thermal choke, then actively controlling the temperature with heating elements. This made it possible to operate the array at user selected, stable substrate temperatures ranging from ambient temperature to below 150 K. This capability makes it possible to select the infrared background level that the array operates at, and to operate with background levels that are adequate for testing the high altitude/exoatmospheric engagements. WISP arrays were designed for room temperature operation, but predicted performance at reduced temperatures appears acceptable. Tests were performed with a Phase I prototype WISP array inside the KVACC Source Chamber. Data on this array's radiometric response at various substrate temperatures are presented. It is demonstrated that the arrays can be operated at substrate temperatures as low as 145 K. Currently two Phase 3 WISP arrays and a dichroic beam combiner are being installed in the Source Chamber for 2- color testing.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack R. Lippert, David S. Flynn, Lawrence E. Jones, and James R. Kircher "Thermo-optical characterization of a low-background infrared chamber and wideband infrared scene projector (WISP) array for hardware-in-the-loop testing", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352907
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KEYWORDS
Cameras

Temperature metrology

Calibration

Helium

Sensors

Black bodies

Projection systems

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