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26 July 1999 Improvements in uncooled systems using bias equalization
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This paper describes a new approach for the control of microbolometer detector array uniformity as a function of substrate temperature change. This approach, called the bias equalization method, uses an electronic means of controlling the microbolometer array uniformity. For this method a three stage non-uniformity correction algorithm is employed. The first stage corrects for substrate temperature non- uniformity effects on the microbolometer detector elements followed by traditional offset and gain non-uniformity correction stages. To correct for substrate temperature non- uniformity effects, bias equalization coefficients are supplied to the readout integrated circuit (ROIC) to allow the control of a unique operating bias or temperature delta for each microbolometer detector element in the array. The bias equalization method circuitry allows microbolometer array non-uniformity control over a wider range of ROIC substrate temperatures while maintaining better than 80 mK NEdT using f/1.8 optics. This approach is expected to allow removal of the thermoelectric cooler from uncooled systems, thus making it ideally suited for high-volume, low-cost, low-power and low-weight production applications.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William J. Parrish and James T. Woolaway II "Improvements in uncooled systems using bias equalization", Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999);

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