Wavelet-based two-dimensional corner detection

Zhan Wang; Fukan Huang; Jianwei Wan

doi:10.1117/12.341309

9 March 1999 Wavelet-based two-dimensional corner detection

Zhan Wang, Fukan Huang, Jianwei Wan

Proceedings Volume 3715, Optical Pattern Recognition X; (1999) https://doi.org/10.1117/12.341309
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

A multi-scale wavelet-based non-parametric algorithm for detecting and locating corners in 2D images is proposed. First using zero-crossing-based 2D edge detector we can get the edge elements, after edge linking and give each planar curve its orientation space representation we can get the orientation curves. Based on the multi-scale wavelet transform of the orientation curves we can utilize the information of local maximum positions to detect and locate the corners. Experimental results with some synthetic and real images show that this algorithm has high precision and stability of the corner detection and location.

Citation Download Citation

Zhan Wang, Fukan Huang, and Jianwei Wan "Wavelet-based two-dimensional corner detection", Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); https://doi.org/10.1117/12.341309

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