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8 April 1999 Optical properties of Zn1-xMgxSe epilayers studied by reflection spectroscopy
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Abstract
Linear optical properties of the Zn1-xMgxSe (0 1-xMgxSe epilayers were investigated as a function of Mg composition (0
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grzegorz Glowacki and Waclaw Bala "Optical properties of Zn1-xMgxSe epilayers studied by reflection spectroscopy", Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); https://doi.org/10.1117/12.344739
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