Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices

Francesca Varsano; A. V. Krasilnikova; Franco Decker; Enrico Masetti

doi:10.1117/12.360069

7 September 1999 Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices

Francesca Varsano, A. V. Krasilnikova, Franco Decker, Enrico Masetti

Author Affiliations +

Proceedings Volume 3738, Advances in Optical Interference Coatings; (1999) https://doi.org/10.1117/12.360069
Event: Optical Systems Design and Production, 1999, Berlin, Germany

Abstract

Films of Ce-V mixed oxide were deposited by reactive r.f. sputtering from a target of cold pressed CeO₂ and V₂O₅ mixed powders. Optical and ion storage properties of the films have been studied in function of the oxygen partial pressure inside the sputtering chamber during the deposition process. Li intercalation was accomplished electrochemically. Optical constants have been determined for as-deposited and intercalated films.

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Francesca Varsano, A. V. Krasilnikova, Franco Decker, and Enrico Masetti "Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices", Proc. SPIE 3738, Advances in Optical Interference Coatings, (7 September 1999); https://doi.org/10.1117/12.360069

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