Adaptive speckle pattern interferometry

Janos Kornis; Zoltan Fuzessy; Attila Nemeth

doi:10.1117/12.347739

7 May 1999 Adaptive speckle pattern interferometry

Janos Kornis, Zoltan Fuzessy, Attila Nemeth

Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347739
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan

Abstract

In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The peculiarity of this technique is that reference waves are produced by holographically reconstructed virtual images. Using this course an adaptive measuring system can be built. A realization of the ASPI is presented as a measuring device for various measuring tasks. Selected applications are shown from real time holography to comparative displacement measurement.

Citation Download Citation

Janos Kornis, Zoltan Fuzessy, and Attila Nemeth "Adaptive speckle pattern interferometry", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347739

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