Paper
7 May 1999 Spectroscopic study on second-harmonic generation from a reconstructed silicon surface
Jun Chen, Dehuan Huang
Author Affiliations +
Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347716
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
The pump wavelength dependence of the optical second harmonic generation from Si(100)-2x1 has been investigated by use of a tunable Ti:Sapphire laser. Significant enhancement of second harmonic signal around pump wavelength of 850 nm was observed. Such an enhancement is considered be caused by resonance related to Si surface dangling-bond states.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Chen and Dehuan Huang "Spectroscopic study on second-harmonic generation from a reconstructed silicon surface", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347716
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KEYWORDS
Second-harmonic generation

Silicon

Spectroscopy

Optical filters

Polarization

Harmonic generation

Sapphire lasers

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