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13 August 1999 Application of wavelet filters for feature extraction in interferometric fringe patterns
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Proceedings Volume 3744, Interferometry '99: Techniques and Technologies; (1999)
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland
The fast and reliable localization and classification of fault indicating fringe patterns in interferometric images is a major task in holographic non-destructive testing. For the purpose of feature extraction from gray value images, wavelet transformation has proved to be a suitable tool. In contrast to the Fourier transformation the local feature information will be preserved and furthermore the applied transforming wavelet can be adapted--under certain constraints--to the given problem.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Kayser, Wolfgang Osten, Sven Krueger, and Guenther K.G. Wernicke "Application of wavelet filters for feature extraction in interferometric fringe patterns", Proc. SPIE 3744, Interferometry '99: Techniques and Technologies, (13 August 1999);

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