Paper
19 July 1999 How knowledge about speckle intensity and phase gradients can improve electronic speckle pattern interferometry
Heinz Helmers, Jan Burke
Author Affiliations +
Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.355083
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
As is well known, the spatial coherence in a speckle field is limited to an area called the mean speckle size. Throughout this area, the coherence decays smoothly from the center to the margin of a speckle, and the degree of coherence between two points (x1,y1) and (x2,y2) determines the probable amount of deviations between their intensities I1, I2 and phases. These deviations are of special importance when spatial phase shifting is applied in electronic speckle pattern interferometry. We demonstrate that the knowledge about the intensity and phase gradients in the object speckle pattern can be used to reduce the noise in measured deformation maps significantly.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heinz Helmers and Jan Burke "How knowledge about speckle intensity and phase gradients can improve electronic speckle pattern interferometry", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.355083
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Speckle pattern

Phase shift keying

Interferometry

Surface plasmons

Light scattering

Phase shifting

Back to Top