Paper
19 July 1999 Light scattering by rough dielectric surface: antireflection effect and nonlinear-optical characterization of the roughness
Anastasia S. Gruzdeva, Vitali E. Gruzdev
Author Affiliations +
Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354944
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
Computational modeling of light scattering at dielectric surface with sine and random roughness has allowed to calculate space distribution of both transmitted and reflected scattered waves, dependence of their amplitudes on roughness amplitude and period in case of sine roughness. Obtained results show possibility of antireflection effect. On the other hand, possibility to use nonlinear laser- induced variations of refraction index for roughness characterization is shown too.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anastasia S. Gruzdeva and Vitali E. Gruzdev "Light scattering by rough dielectric surface: antireflection effect and nonlinear-optical characterization of the roughness", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354944
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KEYWORDS
Dielectrics

Light scattering

Surface roughness

Scattering

Antireflective coatings

Glasses

Laser scattering

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