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19 July 1999 Phase jump under surface plasmon resonance and its use for biosensing and microscopy
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Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354837
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
Interferometry that detects phase jumps of a beam reflected under surface plasmon resonance (SPR) has been developed for bio- and chemical sensing and microscopy. In our approach the near-field of surface plasmon is used to detect monolayer reactions on a metal surface or to visualize ultra-thin films. Comprehensive theoretical model and its experimental verification are presented. A number of prospective device schemes has been developed that provide sensitivity much higher as compared to the traditional SPR sensors and equally wide dynamic range. The proposed technique has been used for a `phase jump' SPR microscopy. It can also be used for Gene Chips and High Throughput Screening analyses.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petr I. Nikitin "Phase jump under surface plasmon resonance and its use for biosensing and microscopy", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354837
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