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19 July 1999 Surfaces analysis based on subfringe integral method
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Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.355011
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
This work shows the most used techniques for fringe analysis and presents a novel technique based on sub-fringe integral method with carrier frequencies, for phase retrieval. This method integrates one fringe into various subfringes to obtain the phase value. Several experiments were performed to obtain the information of flatness and profile from the surface to be analyzed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Iza Melao, Edison Goncalves, and Mikiya Muramatsu "Surfaces analysis based on subfringe integral method", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.355011
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