Microwave sensors for nondestructive testing of materials

Tuami Lasri; David Glay; Ahmed Mamouni; Yves Leroy

doi:10.1117/12.365711

15 October 1999 Microwave sensors for nondestructive testing of materials

Tuami Lasri, David Glay, Ahmed Mamouni, Yves Leroy

Proceedings Volume 3752, Subsurface Sensors and Applications; (1999) https://doi.org/10.1117/12.365711
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Much of today's applications in nondestructive testing by microwaves use an automatic network analyzer. As a result, there is a need for systems to reduce the cost of this kind of techniques. Fortunately, now we can benefit from the cost reduction of the microwave components, induced by the considerable development of the communication market, around 2 and 10 GHz. So, it seems reasonable to think that microwaves will take advantage of this new situation to assert themselves in this application field. In this context we conceive and develop original equipment competitive in term of price and reliability.

Citation Download Citation

Tuami Lasri, David Glay, Ahmed Mamouni, and Yves Leroy "Microwave sensors for nondestructive testing of materials", Proc. SPIE 3752, Subsurface Sensors and Applications, (15 October 1999); https://doi.org/10.1117/12.365711

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