Return-path polarimeter for two-dimensional birefringence distribution measurement

Michael I. Shribak; Yukitoshi Otani; Toru Yoshizawa

doi:10.1117/12.366325

Translator Disclaimer

25 October 1999 Return-path polarimeter for two-dimensional birefringence distribution measurement

Michael I. Shribak, Yukitoshi Otani, Toru Yoshizawa

Author Affiliations +

Proceedings Volume 3754, Polarization: Measurement, Analysis, and Remote Sensing II; (1999) https://doi.org/10.1117/12.366325
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The paper covers an issue of method and device for measurement of 2D retardance and principal plane azimuth distributions. The system based on the use of a laser return-path polarimeter which consists of a rotating polarizing beam splitter and a quarter wave plate. Two or four sets from four images are used for birefringence analysis. This allows to decrease the errors caused by imperfection of a polarizing beam splitter and a quarter wave plate. The basic expressions that describe the operation of the systems are presented. The main sources of error are discussed. The measured results of the 2D birefringence distribution of a plastic and standard phase plate of retardation are shown.

Citation Download Citation

Michael I. Shribak, Yukitoshi Otani, and Toru Yoshizawa "Return-path polarimeter for two-dimensional birefringence distribution measurement", Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); https://doi.org/10.1117/12.366325

ACCESS THE FULL ARTICLE