Improving the high-energy sensitivity of x-ray CCDs

Adam Keay; Andrew D. Holland; David J. Burt

doi:10.1117/12.366540

22 October 1999 Improving the high-energy sensitivity of x-ray CCDs

Adam Keay, Andrew D. Holland, David J. Burt

Proceedings Volume 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X; (1999) https://doi.org/10.1117/12.366540
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We present a method of improving the quantum efficiency of MOS CCDs. We show that a change of operation can increase the depletion depth of standard bulk devices. The conclusions point to a point to a potential increase in the depletion depth of 300 percent by the use of optimized materials and operating conditions.

Citation Download Citation

Adam Keay, Andrew D. Holland, and David J. Burt "Improving the high-energy sensitivity of x-ray CCDs", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); https://doi.org/10.1117/12.366540

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