Defect depth profiling of CdZnTe using high-energy diffraction measurements

Mark S. Goorsky; H. Yoon; M. Ohler; K. Liss

doi:10.1117/12.366574

19 October 1999 Defect depth profiling of CdZnTe using high-energy diffraction measurements

Mark S. Goorsky, H. Yoon, M. Ohler, K. Liss

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366574
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We utilized monochromatic high energy synchrotron x-rays to perform transmission diffraction measurements on bulk cadmium zinc telluride crystal used for room temperature radiation detectors. The high-energy measurements assess the crystalline properties throughout the thickness of the structures and we determined - in combination with standard high-resolution diffraction measurements - that most defects propagate through the width of the sample. Maps of both composition and crystalline quality were generated using both the high energy and standard diffraction sources and a clear correlation was observed for both composition variation and for mosaic structure. In some cases, up to twenty individual peaks are observed in a rocking curve with a beam size of 100 X 100 micrometers ² which allows for a determination of the crystallite size. This experiment represents the first time in which transmission high-energy x-ray diffraction techniques have been applied to examine the crystal quality of Cd_1-xZn_xTe used in nuclear radiation detector applications. The technique allows one to measure the bulk structural properties of thick crystals and the technique is particularly useful because these crystal are used as bulk devices. Hence, this enables one to perform a proper analysis of the relationship between the structural defects and the detector performance.

Citation Download Citation

Mark S. Goorsky, H. Yoon, M. Ohler, and K. Liss "Defect depth profiling of CdZnTe using high-energy diffraction measurements", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366574

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