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19 October 1999 Experimental analysis of current noise spectra in CdTe detectors
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In this paper we analyze in detail a peculiar behavior of CdTe detectors, namely the fact that in conjunction with a typical resistive electrical characteristic in which the current is proportional to the externally applied biasing voltage through an equivalent detector resistance, the detector shows a noise level well above the corresponding Johnson noise and close to the shot noise of the standing current. By using a correlation spectrum analyzer, a careful and extensive experimental analysis of the current noise behavior of CdTe detectors for X and (gamma) ray has been performed. The current noise spectra have been measured over a wide range of frequencies, from below 1Hz up to 100kHz and operating points from 0V up to 150V. In addition to a strong 1/f component, a white noise is present at the level of the shot noise of the standing current and extending in frequency for a limited range related to the carriers transit time across the detector.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Bertuccio, Giorgio Ferrari, Pietro Gallina, Marco Sampietro, Ezio Caroli, Ariano Donati, and Waldes Dusi "Experimental analysis of current noise spectra in CdTe detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999);

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