Experimental analysis of current noise spectra in CdTe detectors

Giuseppe Bertuccio; Giorgio Ferrari; Pietro Gallina; Marco Sampietro; Ezio Caroli; Ariano Donati; Waldes Dusi

doi:10.1117/12.366606

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19 October 1999 Experimental analysis of current noise spectra in CdTe detectors

Giuseppe Bertuccio, Giorgio Ferrari, Pietro Gallina, Marco Sampietro, Ezio Caroli, Ariano Donati, Waldes Dusi

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Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366606
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

In this paper we analyze in detail a peculiar behavior of CdTe detectors, namely the fact that in conjunction with a typical resistive electrical characteristic in which the current is proportional to the externally applied biasing voltage through an equivalent detector resistance, the detector shows a noise level well above the corresponding Johnson noise and close to the shot noise of the standing current. By using a correlation spectrum analyzer, a careful and extensive experimental analysis of the current noise behavior of CdTe detectors for X and (gamma) ray has been performed. The current noise spectra have been measured over a wide range of frequencies, from below 1Hz up to 100kHz and operating points from 0V up to 150V. In addition to a strong 1/f component, a white noise is present at the level of the shot noise of the standing current and extending in frequency for a limited range related to the carriers transit time across the detector.

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Giuseppe Bertuccio, Giorgio Ferrari, Pietro Gallina, Marco Sampietro, Ezio Caroli, Ariano Donati, and Waldes Dusi "Experimental analysis of current noise spectra in CdTe detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366606

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