Paper
22 September 1999 Recent observations with phase-contrast x-ray computed tomography
Atsushi Momose, Tohoru Takeda, Yuji Itai, Jinhong Tu, Keiichi Hirano
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Abstract
Recent development in phase-contrast X-ray computed tomography using an X-ray interferometer is reported. To observe larger samples than is possible with our previous X-ray interferometer, a large monolithic X-ray interferometer and a separated-type X-ray interferometer were studied. At the present time, 2.5 cm X 1.5 cm interference patterns have been generated with the X-ray interferometers using synchrotron X-rays. The large monolithic X-ray interferometer has produced interference fringes with 80% visibility, and has been used to measure various tissues. To produce images with higher spatial resolution, we fabricated another X-ray interferometer whose wafer was partially thinned by chemical etching. A preliminary test suggested that the spatial resolution has been improved.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Atsushi Momose, Tohoru Takeda, Yuji Itai, Jinhong Tu, and Keiichi Hirano "Recent observations with phase-contrast x-ray computed tomography", Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); https://doi.org/10.1117/12.363720
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Cited by 3 scholarly publications.
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KEYWORDS
X-rays

Interferometers

X-ray imaging

X-ray computed tomography

Tissues

Semiconducting wafers

Spatial resolution

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