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6 October 1999 CVD diamond films for synchrotron radiation beam monitoring
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Abstract
Free-standing polycrystalline diamond films grown by microwave plasma CVD technique were tested for detection X- ray radiation from a synchrotron source. Two different configurations of collection electrodes on diamond were used. The first (sandwich) geometry uses a thin amorphous conducting layers formed by nitrogen ion irradiation on both sides of the diamond plate. The second (planar) one, which showed better characteristics, comprises of an interdigitated planar array of metallic contacts on a face exposed to photon flux. However, in both cases a polarization effect that leads to a decrease of the detector response with exposition time, was observed. Better device performance is expected for diamond films of improved quality.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sultan B. Dabagov, Igor I. Vlasov, Violetta A. Murashova, Mikhail V. Negodaev, Victor G. Ralchenko, Rustem V. Fedorchuk, and Mikhail N. Yakimenko "CVD diamond films for synchrotron radiation beam monitoring", Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); https://doi.org/10.1117/12.367118
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