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6 October 1999 Two approaches to hybrid x-ray pixel array readout
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Abstract
We have designed two different X-ray pixel array readout Integrated Circuits for silicon pixel detectors operating between 4 keV and 25 keV. The first allows full readout of the deposited charge for each X-ray photon and is intended for imaging X-ray spectroscopy. The second is a photon counting device capable of very high rates (1 MHz per pixel) but without energy resolution. This paper compares the architectures of these two detectors and presents experimental data from complete bump-bonded devices. These detectors have many applications from X-ray diffraction to material inspection and satellite based X-ray imaging.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul Seller, Greg Bale, William J. F. Gannon, G. Hall, Andrew D. Holland, Gregory M. Iles, Anthony R. Jorden, Barrie G. Lowe, P. Murray, M. S. Passmore, Mark Lyndon Prydderch, K. M. Smith, Stephen L. Thomas, and Richard Wade "Two approaches to hybrid x-ray pixel array readout", Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); https://doi.org/10.1117/12.367120
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