Manufacture of LIGO core optics at CSIRO

Christopher J. Walsh; Achim J. Leistner; Bozenko F. Oreb; Jeffrey A. Seckold; David I. Farrant; Ronald W. Bulla; Glenn Davis; Phillip J. Lennox; Frank J. Lesha; Edita Pavlovic; Wayne Stuart; Carl M. Sona; Ruimin Yin

doi:10.1117/12.369187

11 November 1999 Manufacture of LIGO core optics at CSIRO

Christopher J. Walsh, Achim J. Leistner, Bozenko F. Oreb, Jeffrey A. Seckold, David I. Farrant, Ronald W. Bulla, Glenn Davis, Phillip J. Lennox, Frank J. Lesha, Edita Pavlovic, Wayne Stuart, Carl M. Sona, Ruimin Yin

Author Affiliations +

Proceedings Volume 3782, Optical Manufacturing and Testing III; (1999) https://doi.org/10.1117/12.369187
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The manufacture and testing of the 'core' optical substrates for the Laser Interferometer Gravitational-wave Observatory (LIGO) are described in this paper. These substrates are for use in long baseline Michelson interferometers with Fabry Perot cavities up to 4 km in length in each arm. The optical surfaces of the substrates (250 mm diameter by up to 100 mm thick) are specified either flat or curved, with radii of curvature varying between 7 and 15 km and tolerance bands on the radius equivalent to variations in the sag (over 200 mm) of twenty nanometers or so. Very strict tolerances were also placed on the astigmatism of the surfaces and the surface errors in two spatial frequency bands, one at low frequencies ('waviness') and another at high frequencies ('roughness'). In some cases the radius of the wavefront emerging from the substrate was also specified (for a collimated test beam).

Citation Download Citation

Christopher J. Walsh, Achim J. Leistner, Bozenko F. Oreb, Jeffrey A. Seckold, David I. Farrant, Ronald W. Bulla, Glenn Davis, Phillip J. Lennox, Frank J. Lesha, Edita Pavlovic, Wayne Stuart, Carl M. Sona, and Ruimin Yin "Manufacture of LIGO core optics at CSIRO", Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); https://doi.org/10.1117/12.369187

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
10 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Polishing

Surface finishing

LIGO

Wavefronts

Tolerancing

Optics manufacturing

Silicon

Show All Keywords

Keywords/Phrases

Search In:

Publication Years