Measurement and analysis of thermal radiation characteristics of infrared scene projector resistor array

Yuqin Gu; Dezhong Zhu; Pingzhi Liang; Zuo Liang Wu; Hongsong Li

doi:10.1117/12.365765

13 October 1999 Measurement and analysis of thermal radiation characteristics of infrared scene projector resistor array

Yuqin Gu, Dezhong Zhu, Pingzhi Liang, Zuo Liang Wu, Hongsong Li

Author Affiliations +

Proceedings Volume 3783, Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids; (1999) https://doi.org/10.1117/12.365765
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The IR scene projector consisted of resistor array is an important device in the IR simulation technology. An enhanced version of the resistor array is currently under development. Thermal radiation characterization is necessary for the performance evaluation of the device. The resistor and its array are tested by the microscopic set of a thermal video system. The dependence of the radiation temperature on control voltage, the radiation power of the resistor, the uniformity of the radiation temperature, as well as the dynamic characteristic have been measured. An evaluation of thermal radiation characteristics of the resistor array has been provided. At the same time the effective emissivity of the resistor has been measured to obtain the true temperature distribution. It is possible to be used to improve the thermal design of this device.

Citation Download Citation

Yuqin Gu, Dezhong Zhu, Pingzhi Liang, Zuo Liang Wu, and Hongsong Li "Measurement and analysis of thermal radiation characteristics of infrared scene projector resistor array", Proc. SPIE 3783, Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids, (13 October 1999); https://doi.org/10.1117/12.365765

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