Paper
30 June 1999 Glancing angle deposition: recent research results
Michael J. Brett, Mary W. Seto, Jeremy C. Sit, Ken D. Harris, Doug Vick, Kevin Robbie
Author Affiliations +
Abstract
Unique thin film microstructures have been fabricated with the Glancing Angle Deposition (GLAD) technique. These porous, thin films can be engineered with a variety of different morphologies to sub-micron dimensions, including helical, post, and chevron or zigzag microstructures. This paper reports some recent results in study and application of films deposited using GLAD, namely: the use of low pressure, long throw sputtering to produce porous titanium films; deposition of porous, structured ZrO2 films for use as thermal barriers; and measurement of the mechanical response of chiral or `microspring' thin films.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael J. Brett, Mary W. Seto, Jeremy C. Sit, Ken D. Harris, Doug Vick, and Kevin Robbie "Glancing angle deposition: recent research results", Proc. SPIE 3790, Engineered Nanostructural Films and Materials, (30 June 1999); https://doi.org/10.1117/12.351243
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Cited by 7 scholarly publications.
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KEYWORDS
Sputter deposition

Thin films

Fabrication

Scanning electron microscopy

Titanium

Zirconium dioxide

Atomic force microscopy

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