Numerical comparison between shear force, constant height, and constant intensity images in scanning near-field optical microscopy

Mufei Xiao; Xin Chen

doi:10.1117/12.363854

22 September 1999 Numerical comparison between shear force, constant height, and constant intensity images in scanning near-field optical microscopy

Mufei Xiao, Xin Chen

Author Affiliations +

Proceedings Volume 3791, Near-Field Optics: Physics, Devices, and Information Processing; (1999) https://doi.org/10.1117/12.363854
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We present a numerical comparison between shear-force, constant-height and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three images. Two type of incident light are tested of polarization in perpendicular and parallel direction with respect to the mean plane of the surface. Merits and demerits of the three images are discussed.

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Mufei Xiao and Xin Chen "Numerical comparison between shear force, constant height, and constant intensity images in scanning near-field optical microscopy", Proc. SPIE 3791, Near-Field Optics: Physics, Devices, and Information Processing, (22 September 1999); https://doi.org/10.1117/12.363854

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