Ultralarge-band optical characterization of optomicrowave devices

Jean-Francois Roux; Jean-Louis Coutaz; S. TedJini Smail

doi:10.1117/12.370193

12 November 1999 Ultralarge-band optical characterization of optomicrowave devices

Jean-Francois Roux, Jean-Louis Coutaz, S. TedJini Smail

Proceedings Volume 3795, Terahertz and Gigahertz Photonics; (1999) https://doi.org/10.1117/12.370193
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We present an original method for characterizing opto- microwave devices up to THz modulation frequencies. This method is based on the measurement of the temporal response of devices excited by a laser pulse. The transfer function of the device is obtained by a numerical FFT of the experimental temporal response. Using ultrashort laser pulses, we are able to obtain this response from DC up to a few THz. In order to demonstrate the feasibility of the method, we have characterized an integrated optical Mach- Zehnder interferometer. The optical path difference between the two arms of the interferometer is about 6.6 mm leading to interferences in the tens of GHz frequency domain. This opto-microwave device has been characterized from 10 GHz to 2.0 THz. The first rejected frequency is around 15 GHz and the free spectral range is 30 GHz. This device may be used as a sub-carrier frequency filter for all-optical signal processing in high-rate optical communication systems.

Citation Download Citation

Jean-Francois Roux, Jean-Louis Coutaz, and S. TedJini Smail "Ultralarge-band optical characterization of optomicrowave devices", Proc. SPIE 3795, Terahertz and Gigahertz Photonics, (12 November 1999); https://doi.org/10.1117/12.370193

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