Transient studies of deep traps in electroluminescent polymers

Alasdair J. Campbell; Donal D. C. Bradley

doi:10.1117/12.372727

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17 December 1999 Transient studies of deep traps in electroluminescent polymers

Alasdair J. Campbell, Donal D. C. Bradley

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Proceedings Volume 3797, Organic Light-Emitting Materials and Devices III; (1999) https://doi.org/10.1117/12.372727
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Charge trapping will have a strong effect on the performance of organic light emitting diodes. Here different models for such trapping in disordered organic semiconductors are presented. The benefits of different transient experimental techniques are explored. Results are presented for electroluminescent polymer diodes which are fully depleted or contain a depletion region type Schottky barrier. The transient behavior can be explained by a single energy trap site emptying to a Gaussian distribution of transport sites.

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Alasdair J. Campbell and Donal D. C. Bradley "Transient studies of deep traps in electroluminescent polymers", Proc. SPIE 3797, Organic Light-Emitting Materials and Devices III, (17 December 1999); https://doi.org/10.1117/12.372727

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