Paper
20 September 1999 Precise measurement of the amplitude of photorefractive index gratings
Ching-Cherng Sun, Chung-Chen Tu, M. C. Chen, Peing T. Chung, Shoang C. Donn
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Abstract
Several photorefractive crystals such as LiNbO3 or BaTiO3 can be used for optical information storage as well as key elements for optical signal processing due to their unique property, viz., their refractive index varies according to their incident light distribution. Thus, we can construct phase gratings inside the crystals by using interference of two light beams. The index grating amplitude (Delta) n can be computed from the equation derived from the Band Transport model for the photorefractive effect. Experimentally, the value of (Delta) n can be estimated from counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. Its precision is about 13%. Here we report a new method improving the measurement precision to about 1% by adding the measurement for the diffraction efficiency as a function of angle mismatch. This precise measurement of (Delta) n allows us to quantify photorefractive effect with greater precision.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ching-Cherng Sun, Chung-Chen Tu, M. C. Chen, Peing T. Chung, and Shoang C. Donn "Precise measurement of the amplitude of photorefractive index gratings", Proc. SPIE 3801, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications V, (20 September 1999); https://doi.org/10.1117/12.363946
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Cited by 2 scholarly publications.
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KEYWORDS
Diffraction gratings

Diffraction

Crystals

Photorefraction

Phase matching

Refractive index

Laser crystals

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