Microscopic image analysis of defect areas in optical disks

Pierre L'Hostis; Frederick Byers; Fernando Luis Podio; Xiao Tang

doi:10.1117/12.371152

30 November 1999 Microscopic image analysis of defect areas in optical disks

Pierre L'Hostis, Frederick Byers, Fernando Luis Podio, Xiao Tang

Proceedings Volume 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks; (1999) https://doi.org/10.1117/12.371152
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

This paper presents techniques developed at the Information Technology Laboratory of the U.S. National Institute of Standards and Technology (NIST/ITL) for enabling microscopic image analysis of optical data storage media such as optical disks. These non-destructive techniques allow investigators to easily locate on the media a pre-existing series of media defects. These techniques can be applied to any type of optical disks including CDs and DVDs. The paper describes the experimental setup and the techniques utilized to achieve localization and registration of media defects. These techniques include data acquisition, computer control, auto focus, image processing, and remote control and observation. An extension of this setup utilizing available graphical programming environments can allow investigators at different locations to share and discuss the information on media defects by use of the Internet.

Citation Download Citation

Pierre L'Hostis, Frederick Byers, Fernando Luis Podio, and Xiao Tang "Microscopic image analysis of defect areas in optical disks", Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); https://doi.org/10.1117/12.371152

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