Wavelet-based denoising and ratiometric recombination of polarization-modulated stress-induced birefringence measurement signals

Jeffrey R. Mackey; Kamal K. Das

doi:10.1117/12.372923

15 December 1999 Wavelet-based denoising and ratiometric recombination of polarization-modulated stress-induced birefringence measurement signals

Jeffrey R. Mackey, Kamal K. Das

Author Affiliations +

Proceedings Volume 3858, Advanced Materials and Optical Systems for Chemical and Biological Detection; (1999) https://doi.org/10.1117/12.372923
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

We have developed an instrument that measures fast transient birefringence and polymer chain orientation angle in complex fluids. This instrument uses a dual-crystal transverse Electro-Optic modulator with second crystal's modulation voltage applied 180 degree(s) out of phase from that of the first crystal. The precise measurement of birefringence using this instrument strictly depends on three separate signals. These are the dc, first and second harmonic voltages. The harmonics are relatively noise-free while the dc signal is subject to appreciable noise. Therefore, wavelet based noise reduction techniques have been used to denoise the measured dc signal. The de-noised signal was recombined with the harmonic signals to obtain retardation and birefringence measurements using a high precision 1/16 wave plate in a rotating mount to simulate a birefringence sample.

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Jeffrey R. Mackey and Kamal K. Das "Wavelet-based denoising and ratiometric recombination of polarization-modulated stress-induced birefringence measurement signals", Proc. SPIE 3858, Advanced Materials and Optical Systems for Chemical and Biological Detection, (15 December 1999); https://doi.org/10.1117/12.372923

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KEYWORDS

Birefringence

Wavelets

Interference (communication)

Denoising

Electrooptic modulators

Crystals

Signal to noise ratio

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