Paper
9 December 1999 Accurate characterization of Bragg-grating-based optical devices
B. M. Azizur Rahman, Markus Plura, J. M. Gomoluch, Kenneth T. V. Grattan
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Abstract
Bragg grating-based optical systems are important for both telecommunications and sensor applications. Work to data on the simulation of such systems has been concentrated upon using approximate methods such as the coupled mode theory (CMT). In this work, a combination of three numerical methods has been used, all of which are rigorous and at the same time computationally very efficient. The new approach presented here incorporates the finite element, the least squares boundary residual and the transfer matrix methods. Our simulated results show that the CMT could be adequate for Bragg grating devices in fiber, since perturbed refractive index change is small. However, for Bragg grating devices in semiconductors, CMT could generate less accurate results. Simulated results for various types of grating devices, such as uniform, chirped, apodized, phase-shifted, super-structures and sampled grating devices are presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. M. Azizur Rahman, Markus Plura, J. M. Gomoluch, and Kenneth T. V. Grattan "Accurate characterization of Bragg-grating-based optical devices", Proc. SPIE 3860, Fiber Optic Sensor Technology and Applications, (9 December 1999); https://doi.org/10.1117/12.372981
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KEYWORDS
Fiber Bragg gratings

Semiconductors

Refractive index

Scattering

Finite element methods

Optical fibers

Semiconductor lasers

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