Paper
1 February 2000 Modeling and diagnostics of pulsed laser-solid interactions: applications to laser cleaning
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Proceedings Volume 3885, High-Power Laser Ablation II; (2000) https://doi.org/10.1117/12.377000
Event: Advanced High-Power Lasers and Applications, 1999, Osaka, Japan
Abstract
The present study concerns the cleaning of materials using pulsed laser irradiation and it summarizes the most recent results obtained by the collaborative research of different European groups, within the framework of a European program for training and mobility of researchers. A series of pulsed lasers, which emit at various wavelengths (from UV to IR) with short duration of pulse (few nano-, pico- or femto- seconds), is used for the removal of metallic, ceramic and organic pollutants from contaminated solid surfaces of different natures. The scientific results obtained so far are focused on the laser cleaning of silicon wafers from sub-micrometer particles, the theoretical modeling of particles removal mechanism during dry laser cleaning, the removal of oxide layers from oxidized metals and alloys, as well as on the development of laser imaging as a diagnostic tool for the estimation of the efficiency of the proposed cleaning technique.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roland Oltra, Enno Arenholz, Paul Leiderer, Wolfgang Kautek, Costas Fotakis, Michel L. Autric, Carmen N. Afonso Rodriguez, and Paul Wazen "Modeling and diagnostics of pulsed laser-solid interactions: applications to laser cleaning", Proc. SPIE 3885, High-Power Laser Ablation II, (1 February 2000); https://doi.org/10.1117/12.377000
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Cited by 19 scholarly publications.
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KEYWORDS
Pulsed laser operation

Oxides

Particles

Silicon

Diagnostics

Laser ablation

Laser applications

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