Full-field stress/birefringence analysis with a polarizing microscope

Anand Krishna Asundi; Bing Zhao

doi:10.1117/12.369314

11 November 1999 Full-field stress/birefringence analysis with a polarizing microscope

Anand Krishna Asundi, Bing Zhao

Proceedings Volume 3897, Advanced Photonic Sensors and Applications; (1999) https://doi.org/10.1117/12.369314
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore

Abstract

An automatic method of full-field stress measurement using a transmitting micro-polariscope is proposed. A compact optical transmitting polarizing microscope with white light source is rebuilt by developing a loading and recording system, in order to perform a tension test. Both isoclinics and isochromatics are measured in real-time with phase shifting technique. A new simple algorithm for isochromatics is proposed. It is found to be suitable for the current micro-polariscope.

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Anand Krishna Asundi and Bing Zhao "Full-field stress/birefringence analysis with a polarizing microscope", Proc. SPIE 3897, Advanced Photonic Sensors and Applications, (11 November 1999); https://doi.org/10.1117/12.369314

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KEYWORDS

Microscopes

Phase shifts

Phase shifting

Photoelasticity

Fringe analysis

Polarizers

Polymers

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