Dual-axis microscanners for infrared camera

Chai Lay Lee

doi:10.1117/12.368512

4 November 1999 Dual-axis microscanners for infrared camera

Chai Lay Lee

Proceedings Volume 3898, Photonic Systems and Applications in Defense and Manufacturing; (1999) https://doi.org/10.1117/12.368512
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore

Abstract

Loss of image information is a profound problem with conventional IR cameras using focal plane array (FPA) technology. This is due to the limitation of semiconductor fabrication technology which results in ineffective are between the cells of the FPA detector. In this project, dual axis microscanners have been developed to capture the undetected image, as a result, improving the overall image resolution of the IR cameras.

Citation Download Citation

Chai Lay Lee "Dual-axis microscanners for infrared camera", Proc. SPIE 3898, Photonic Systems and Applications in Defense and Manufacturing, (4 November 1999); https://doi.org/10.1117/12.368512

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