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19 October 1999 X-ray-sensitive CCD camera
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Proceedings Volume 3901, Photonics for Transportation; (1999)
Event: Photonics for Transportation, 1999, Prague, Czech Republic
This paper describes the key features and performance data of a 1040(H) X 1160(V) pixels full-frame transfer CCD camera for use as an X-ray detector in X-ray material structure analysis and X-ray fluorescence for the in-situ detection of metals. To achieve good sensitivity at energies below 50 keV we have developed compact units based on VLSI programmable logic devices and intermediate digital signal processing. The analog image output may be displayed on the standard TV-monitor, and also processed and displayed by PC- based data acquisition system. The CCIR TV specification make possible to detect X-ray patterns with a 20 ms exposure times and X-ray intensity more than 5...8 nJ/cm2. The impulse synchronization mode set up exposure times of a few tens to a few hundreds of milliseconds with a proportional level of X-ray intensity with the time resolution 300 ms. Synchronization the imaging detector with X-ray source allows converting X-ray patterns with exposure times before 1 s.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew A. Krasnjuk, Vladimir J. Stenin, Sergei V. Larionov, Victor A. Shilin, and Alexander A. Utenkov "X-ray-sensitive CCD camera", Proc. SPIE 3901, Photonics for Transportation, (19 October 1999);

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