Paper
3 March 2000 Nonlinear absorption phenomena in oxide coatings for 193 nm
Oliver Apel, Klaus R. Mann, Joerg Heber, Roland Thielsch
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Abstract
New absorption measurements for aluminum oxide optical coatings at 193nm are presented. Apart from the strong linear absorption at this wavelength the data indicate a nonlinear absorption within the thin dielectric layer. By varying the laser thickness, the intrinsic contribution of the layer material to the overall absorption was separated from the contribution of the substrate and the interface. In addition, the conditioning behavior of the coatings was examined. A strong long term conditioning in the linear absorption was found for Al2O3 containing systems. Comparing the absorption and conditioning behavior of the single layers and a high-reflective system, we can show that the absorption properties of the HR-system are determined by its Al2O3 layers.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oliver Apel, Klaus R. Mann, Joerg Heber, and Roland Thielsch "Nonlinear absorption phenomena in oxide coatings for 193 nm", Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); https://doi.org/10.1117/12.379311
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Cited by 2 scholarly publications.
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KEYWORDS
Absorption

Nonlinear optics

Oxides

Optical coatings

Silica

Singular optics

Aluminum

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