Optical nanoscale investigation of surface characteristics

Pavel Tomanek

doi:10.1117/12.370429

18 November 1999 Optical nanoscale investigation of surface characteristics

Pavel Tomanek

Proceedings Volume 3904, Fourth International Conference on Correlation Optics; (1999) https://doi.org/10.1117/12.370429
Event: International Conference on Correlation Optics, 1999, Chernivsti, Ukraine

Abstract

In the paper some basic optical near field theoretical approaches will be explained as well as the principles of microscope set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.

Citation Download Citation

Pavel Tomanek "Optical nanoscale investigation of surface characteristics", Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); https://doi.org/10.1117/12.370429

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available