Paper
2 May 2000 Rare-earth-doped HfO2 nanoparticles embedded in SiO2-HfO2 planar waveguides: preparation and optical, structural, and spectroscopic characterization
Sidney J. L. Ribeiro, Rogeria Rocha Goncalves, Younes Messaddeq, Michel Andre Aegerter, Maurizio Montagna, Claire Duverger, Maurizio Ferrari
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Abstract
In this work we present result on the preparation of planar waveguides based on HfO2 and HfO2-SiO$2). Stable sols containing europium and erbium doped HfO2 nanoparticles have been prepared and characterized. The nanosized sol was either deposited on quartz substrates or embedded in (3-glycidoxipropil)trimethoxisilane used as a hybrid host for posterior deposition. The refractive index dispersion and luminescence characteristics were determined for the resulting HfO2 films. The optical parameters of the waveguides such as refractive index, thickness and propagation losses were measured for the hybrid composite. The planar waveguides present thickness of a few micra and support well confined propagating modes.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sidney J. L. Ribeiro, Rogeria Rocha Goncalves, Younes Messaddeq, Michel Andre Aegerter, Maurizio Montagna, Claire Duverger, and Maurizio Ferrari "Rare-earth-doped HfO2 nanoparticles embedded in SiO2-HfO2 planar waveguides: preparation and optical, structural, and spectroscopic characterization", Proc. SPIE 3943, Sol-Gel Optics V, (2 May 2000); https://doi.org/10.1117/12.384353
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KEYWORDS
Nanoparticles

Planar waveguides

Refractive index

Ions

Particles

Spectroscopy

Waveguides

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