Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

Robert W. Herrick; Sui F. Lim; Hongyu Deng; Qing Deng; Jim J. Dudley; Mark R. Keever; Tchang-Hun Oh; Melissa Y. Li; M. Tashima; Lee A. Hodge; Xiaolong Zhang; John Herniman; Pete Evans; Bing Liang; Chun Lei

doi:10.1117/12.384365

1 May 2000 Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

Robert W. Herrick, Sui F. Lim, Hongyu Deng, Qing Deng, Jim J. Dudley, Mark R. Keever, Tchang-Hun Oh, Melissa Y. Li, M. Tashima, Lee A. Hodge, Xiaolong Zhang, John Herniman, Pete Evans, Bing Liang, Chun Lei

Author Affiliations +

Proceedings Volume 3946, Vertical-Cavity Surface-Emitting Lasers IV; (2000) https://doi.org/10.1117/12.384365
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

We discuss the reliability of the oxide VCSELs made by Agilent Technologies (formerly part of Hewlett Packard). Measurements of operating temperature in fiber optic modules are given; these temperatures are higher than generally assumed. General challenges with oxide VCSEL reliability are introduced, and different types of failures are discussed. Long-term oxide VCSEL lifetest results are presented, along with observations about the thermal and current acceleration models. Production monitoring strategies are discussed, and the basic degradation phenomenology is briefly shown.

Citation Download Citation

Robert W. Herrick, Sui F. Lim, Hongyu Deng, Qing Deng, Jim J. Dudley, Mark R. Keever, Tchang-Hun Oh, Melissa Y. Li, M. Tashima, Lee A. Hodge, Xiaolong Zhang, John Herniman, Pete Evans, Bing Liang, and Chun Lei "Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies", Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000); https://doi.org/10.1117/12.384365

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