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1 May 2000 Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies
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Proceedings Volume 3946, Vertical-Cavity Surface-Emitting Lasers IV; (2000)
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States
We discuss the reliability of the oxide VCSELs made by Agilent Technologies (formerly part of Hewlett Packard). Measurements of operating temperature in fiber optic modules are given; these temperatures are higher than generally assumed. General challenges with oxide VCSEL reliability are introduced, and different types of failures are discussed. Long-term oxide VCSEL lifetest results are presented, along with observations about the thermal and current acceleration models. Production monitoring strategies are discussed, and the basic degradation phenomenology is briefly shown.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert W. Herrick, Sui F. Lim, Hongyu Deng, Qing Deng, Jim J. Dudley, Mark R. Keever, Tchang-Hun Oh, Melissa Y. Li, M. Tashima, Lee A. Hodge, Xiaolong Zhang, John Herniman, Pete Evans, Bing Liang, and Chun Lei "Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies", Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000);

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